An automatic test environment for microelectronics education and research
نویسندگان
چکیده
منابع مشابه
An Automatic Test Environment for Microelectronics Education and Research
An automatic test environment (ATE) based on a PSoC has been developed to perform electrical characterization of integrated circuits (ICs). The ICs are designed for academic and research purposes as part of the Electronic Design graduate program at CINVESTAV-Guadalajara Unit; these ICs are manufactured in standard N-well, 5-V, 1.5μm/0.5μm CMOS technologies. The ATE offers programmable capabilit...
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ژورنال
عنوان ژورنال: Journal of Applied Research and Technology
سال: 2008
ISSN: 2448-6736,1665-6423
DOI: 10.22201/icat.16656423.2008.6.01.509