An F-Band $n$ -Probe Standing Wave Detector for Complex Reflection Coefficient Measurements in 40-nm CMOS
نویسندگان
چکیده
منابع مشابه
Simulation of Microstrip Reflectometer System for Complex Reflection Coefficient Measurements
This technical paper presents a simulation of three probes reflectometer system for complex reflection coefficient measurement. This involves designing a circuit of Reflectometer using Genesys software. The simulation results and data from published Three-Probe Reflectometer measurement system is being compared to show the accuracy of the simulation results. Using the design circuit, a microstr...
متن کاملMeasurements of detector nonlinearity at 193 nm.
We have developed a measurement system based on a correlation method to characterize the nonlinearity of a detector's response over a large range of laser pulse energy. The system consists of an excimer-laser source, beam-shaping optics, a beam splitter, a monitor detector, a set of optical filters, and the detector under test. Detector nonlinearities as large as 10% or greater over an entire m...
متن کاملHigh-speed photodiodes in 40 nm standard CMOS technology
This work investigates two silicon (Si) photodiodes (PDs) fabricated in 40 nm standard CMOS technology. The basic structure of the proposed Si PD is formed by N+/P-substrate and N-well/P-substrate diodes. The N+/P-substrate PD demonstrates a responsivity of 0.09 A/W and an electrical bandwidth of 3 GHz for 8 V reverse bias at 520 nm. The N-well/P-substrate PD demonstrates a responsivity of 0.24...
متن کاملAn X-band Standing Wave Dielectric Loaded Accelerating Structure
An 11.4 GHz standing wave Dielectric Loaded Accelerating (DLA) structure was recently developed. The structure is designed to achieve a 120 MV/m gradient powered by a 10 MW 200 ns rf pulse from the X-band Magnicon at the Naval Research Laboratory (NRL). The structure uses on-axis rf coupling, which helps to localize the maximum EM fields within the dielectric region. Bench testing shows excelle...
متن کاملDevelopment of a Symmetric Ring Junction as Four-Port Reflectometer for Complex Reflection Coefficient Measurements
Six-port reflectometer is well-known for its ability to measure magnitude and phase-shift of microwave signal using four power detectors that perform magnitudeonly measurements. This paper presents the development of an innovative symmetric ring junction as four-port reflectometer for complex reflection coefficient measurements. It reduces the number of required detectors to two. Design optimiz...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: IEEE Transactions on Microwave Theory and Techniques
سال: 2019
ISSN: 0018-9480,1557-9670
DOI: 10.1109/tmtt.2019.2932981