An improved LED junction temperature test method based on FCM

Abstract High junction temperature (T j ) of LED will affect the performance and life LED, so this paper proposes a high-power test method. Mainly aiming at problem that accuracy forward current method (FCM) be affected by calibration procedure, equipment aging, technical differences when batch testing T , uses relationship between relative to calibrate procedure based on method, limit negative affection sample heterogeneity. Ten samples were tested in experiment, errors under two methods obtained. The results showed improved was more accurate than traditional Then, error compared with voltage new smaller.