Analysis of Local Texture across Layers in Electron-Beam Melted (EBM) Ti-6Al- 4V via Electron Backscatter Diffraction (EBSD)

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ژورنال

عنوان ژورنال: Microscopy and Microanalysis

سال: 2010

ISSN: 1431-9276,1435-8115

DOI: 10.1017/s1431927610063191