Anelasticity study on electromigration effect in Cu thin films
نویسندگان
چکیده
منابع مشابه
Electromigration in gold thin films
Ž . We study the modification of gold thin film surface by Scanning Tunnelling Microscopy STM and grazing incidence X-ray to understand the process of electromigration. As a result of the applied current we have observed by STM a large movement of matter in the film surface that results in a strong rearrangement and modification of all the surface structures in a matter of minutes. We obtained ...
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ژورنال
عنوان ژورنال: Materials Science and Engineering: A
سال: 2006
ISSN: 0921-5093
DOI: 10.1016/j.msea.2006.02.227