Automatic generation of user-defined test algorithm description file for memory BIST implementation

Memory built-in self-test (BIST) is a widely used technique to allow the and self-checking of embedded memories on chips after fabrication process. It can be by implementing standard testing algorithm available in EDA tool library or user-defined (UDA). This paper presents development software that automatically generates description file UDA deployed for memory BIST circuit implementation using Tessent software. comprises test setup also microprogram coding each instruction executed when performing tests memories. The proposed automation was tested March SR as input results obtained from simulations show output patterns generated implemented match expected passed all tests, which validated correct functionality generation. fast generation file, completed less than 500 ms.