Characterization of wurtzite ZnO using valence electron energy loss spectroscopy

Band transitions in wurtzite GaN and InN determined by valence electron energy loss spectroscopy

Valence electron energy loss spectroscopy (VEELS) was applied to determine band transitions in wurtzite InN, deposited by molecular beam epitaxy on (0001) sapphire substrates or GaN buffer layers. The GaN buffer layer was used as VEELS reference. At room temperature a band transition for wurtzite InN was found at (1.7G0.2 eV) and for wurtzite GaN at (3.3G 0.2 eV) that are ascribed to the fundam...

Characterization of InGaN/GaN quantum well growth using monochromated valence electron energy loss spectroscopy

Electron energy-loss spectroscopy study of ZnO nanobelts.

Nanobelts of ZnO have well-defined shapes that are enclosed by {0001}, {0110} and {2110} facets. The nanobelts grow along [0110] and [2110] with large flat surfaces of +/-(0001) and +/-(0110), respectively. Electron energy-loss spectroscopy has been applied to study the electronic structure of ZnO nanobelts of different growth orientations. A plasmon peak observed at 13 eV is suggested to be th...

Measuring electronic structure of wurtzite InN using electron energy loss spectroscopy

The electronic structure of wurtzite InN has been investigated by electron energy loss spectroscopy ~EELS!. Spectra of the nitrogen K edge and the indium M 4,5 edge have been measured and were compared with calculated partial, N 2p and In 5p conduction band density of states in InN. Excellent agreement on the relative positions of the characteristic peaks were obtained. From low-loss EELS the b...

Scanning confocal electron energy-loss microscopy using valence-loss signals.

Finding a faster alternative to tilt-series electron tomography is critical for rapidly evolving fields such as the semiconductor industry, where failure analysis could greatly benefit from higher throughput. We present a theoretical and experimental evaluation of scanning confocal electron energy-loss microscopy (SCEELM) using valence-loss signals, which is a promising technique for the reliab...