Continuum model description of thin-film growth morphology
نویسندگان
چکیده
منابع مشابه
Continuum model description of thin film growth morphology
We examine the applicability of the continuum model to describe the surface morphology of a hetero-growth system: compositionally-graded, relaxed GeSi films on (001) Si substrates. Surface roughness versus lateral dimension was analyzed for samples what were grown under different conditions. We find that all samples belong to the same growth class, in which the surface roughness scales linearly...
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ژورنال
عنوان ژورنال: Physical Review E
سال: 1997
ISSN: 1063-651X,1095-3787
DOI: 10.1103/physreve.56.1522