Correlating atom probe tomography with x-ray and electron spectroscopies to understand microstructure–activity relationships in electrocatalysts

Specimen preparation for correlating transmission electron microscopy and atom probe tomography of mesoscale features.

Atom-probe tomography (APT) provides atomic-scale spatial and compositional resolution that is ideally suited for the analysis of grain boundaries. The small sample volume analyzed in APT presents, however, a challenge for capturing mesoscale features, such as grain boundaries. A new site-specific method utilizing transmission electron microscopy (TEM) for the precise selection and isolation of...

Determination of Γ’site Occupancies in Nickel Superalloys Using Atom Probe Tomography and X-ray Diffraction (preprint)

Rene88 samples were investigated using atom probe tomography and x-ray diffraction using a monochromated synchrotron beam with different energy values to determine the preferred site occupancy of various alloying elements within the ordered γ’ precipitates. Samples were solutionized and cooled at 24 degree C/min with subsequent aging at 760 degrees C. The synchrotron-based x-ray diffraction res...

Atom probe tomography in nanoelectronics

The role of laser assisted atom probe tomography (APT) in microelectronics is discussed on the basis of various illustrations related to SiGe epitaxial layers, bipolar transistors or MOS nano-devices including gate all around (GAA) devices that were carried out at the Groupe de Physique des Matériaux of Rouen (France). 3D maps as provided by APT reveal the atomic-scale distribution of dopants a...

Correlating Atom Probe Crystallographic Measurements with Transmission Kikuchi Diffraction Data.

Correlative microscopy approaches offer synergistic solutions to many research problems. One such combination, that has been studied in limited detail, is the use of atom probe tomography (APT) and transmission Kikuchi diffraction (TKD) on the same tip specimen. By combining these two powerful microscopy techniques, the microstructure of important engineering alloys can be studied in greater de...

Using Atom-Probe Tomography to Understand ZnOAl=SiO[subscript 2]=Si Schottky Diodes