Crystallographic and Nanomechanical Analysis by Correlative In-situ AFM & SEM

In Situ SEM Nanomanipulation and Nanomechanical/Electrical Characterization

A MEMS device for In Situ TEM/AFM/SEM/STM Testing of Carbon Nanotubes and Nanowires

A MEMS device for in-situ TEM/AFM/SEM/STM testing of nano structures is designed. Two deformation measurement methods are discussed: microscopic measurement and electrical measurement. For the first method, the device consists of a comb-drive actuator, calibration beam and specimen stage. The stiffness of the specimen can be well characterized by comparing the load-displacement relation before ...

Surface Reconstruction From AFM and SEM Images

Nanoscale Crystallographic Analysis in FE-SEM Using Transmission Kikuchi Diffraction

Recent developments in SEM column design have led to the ability to produce nm spot sizes even at high probe currents [1], thus pushing the analytical techniques available in the SEM to conduct microanalysis with nanometer resolution. Although the limitations of microanalysis at these spatial resolution requirements stem from the physics of beam-specimen interaction and the volume from which th...

Morphological Analysis of Polymers on Hair Fibers by SEM and AFM

The polyquaternium 7 polymer is widely used in cosmetic formulations. Morphologic alterations in hair fibers were observed after the application of the polyquaternium 7 polymer, using SEM and AFM. Continuous applications of this product indicated that it accumulates on the fibers, improving the aspect of the hair surface. Quantitative analysis of the images obtained by AFM was undertaken. The...