Defect tolerance in VLSI circuits: techniques and yield analysis
نویسندگان
چکیده
منابع مشابه
Defect Tolerance in VLSI Circuits: Techniques and Yield Analysis
Current very-large-scale-integration (VLSI) technology allows the manufacture of large-area integrated circuits with submicrometer feature sizes, enabling designs with several millions of devices. However, imperfections in the fabrication process result in yield-reducing manufacturing defects, whose severity grows proportionally with the size and density of the chip. Consequently, the developme...
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ژورنال
عنوان ژورنال: Proceedings of the IEEE
سال: 1998
ISSN: 0018-9219
DOI: 10.1109/5.705525