Defects in Heavy-Ion Bombarded Compound Semiconductors Due to the Elastic and Inelastic Energy Loss Regimes
نویسندگان
چکیده
منابع مشابه
Large-angle oscillations in heavy ion elastic and inelastic scattering
The oscillatory behaviour observed at large angles in heavy ion elastic and inelastic scattering cross-sections at energies above the Coulomb barrier, is interpreted as an interference effect between rainbow scattering and the contribution coming from the negative branch of the classical deflection function. In heavy ion reactions, at energies near and above the Coulomb barrier, the structure o...
متن کاملthe role of russia in transmission of energy from central asia and caucuses to european union
پس ازفروپاشی شوروی،رشد منابع نفت و گاز، آسیای میانه و قفقاز را در یک بازی ژئوپلتیکی انرژی قرار داده است. با در نظر گرفتن این منابع هیدروکربنی، این منطقه به یک میدانجنگ و رقابت تجاری برای بازی های ژئوپلتیکی قدرت های بزرگ جهانی تبدیل شده است. روسیه منطقه را به عنوان حیات خلوت خود تلقی نموده و علاقمند به حفظ حضورش می باشد تا همانند گذشته گاز طبیعی را به وسیله خط لوله مرکزی دریافت و به عنوان یک واس...
15 صفحه اولSynergy of elastic and inelastic energy loss on ion track formation in SrTiO3
While the interaction of energetic ions with solids is well known to result in inelastic energy loss to electrons and elastic energy loss to atomic nuclei in the solid, the coupled effects of these energy losses on defect production, nanostructure evolution and phase transformations in ionic and covalently bonded materials are complex and not well understood due to dependencies on electron-elec...
متن کاملImaginary deuteron optical potential due to elastic and inelastic breakup
In collisions between two nuclei the breakup of the projectile into two or more fragments is often a strong reaction channel, which affects not only the imaginary part but also the real part of the corresponding optical potential. This leads to a dynamical polarization potential (DPP) which has to be added to the real potential calculated by the double folding (DFM) models (see eg. a recent rev...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2013
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927613011963