Dielectric characterization of erythrocytes by electrostatic force microscopy
نویسندگان
چکیده
منابع مشابه
Characterization of Dielectric Nanocomposites with Electrostatic Force Microscopy
Nanocomposites physical properties unexplainable by general mixture laws are usually supposed to be related to interphases, highly present at the nanoscale. The intrinsic dielectric constant of the interphase and its volume need to be considered in the prediction of the effective permittivity of nanodielectrics, for example. The electrostatic force microscope (EFM) constitutes a promising techn...
متن کاملMeasuring dielectric properties at the nanoscale using Electrostatic Force Microscopy
R. Arinero, C. Riedel, G. A. Schwartz, G. Lévêque, A. Alegría, Ph. Tordjeman, N. E. Israeloff, M. Ramonda and J. Colmenero 1 IES, UMR CNRS 5214, Université Montpellier II, CC 083, Place E. Bataillon, 34095 Montpellier Cedex, France 2 Donostia International Physics Center (DIPC), Paseo Manuel de Lardizábal 4, 20018 San Sebastián, Spain. 3 Departamento de Física de Materiales UPV/EHU, Facultad de...
متن کاملDielectric properties of thin insulating layers measured by Electrostatic Force Microscopy
In order to measure the dielectric permittivity of thin insulting layers, we developed a method based on electrostatic force microscopy (EFM) experiments coupled with numerical simulations. This method allows to characterize the dielectric properties of materials without any restrictions of film thickness, tip radius and tip-sample distance. The EFM experiments consist in the detection of the e...
متن کاملElectrostatic-free piezoresponse force microscopy
Contact and non-contact based atomic force microscopy (AFM) approaches have been extensively utilized to explore various nanoscale surface properties. In most AFM-based measurements, a concurrent electrostatic effect between the AFM tip/cantilever and sample surface can occur. This electrostatic effect often hinders accurate measurements. Thus, it is very important to quantify as well as remove...
متن کاملDistinguishing magnetic and electrostatic interactions by a Kelvin probe force microscopy–magnetic force microscopy combination
The most outstanding feature of scanning force microscopy (SFM) is its capability to detect various different short and long range interactions. In particular, magnetic force microscopy (MFM) is used to characterize the domain configuration in ferromagnetic materials such as thin films grown by physical techniques or ferromagnetic nanostructures. It is a usual procedure to separate the topograp...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: IOP Conference Series: Materials Science and Engineering
سال: 2019
ISSN: 1757-899X
DOI: 10.1088/1757-899x/699/1/012009