e-Beam Detection of Buried Open Defects in Semiconductor Device
نویسندگان
چکیده
منابع مشابه
influential factors of customer e-loyalty in iranian e-stores
گسترش سریع تکنولوژی و اینترنت مسیر شرکت ها را به نگهداری وفاداری مشتریان الکترونیکی معطوف کرده است. وفاداری مشتریان یک حوزه بسیار جالب برای شرکت ها می باشد و وفاداری مشتریان تاثیر مستقیم بر درآمد و سودزایی شرکتها دارد. با توجه به اهمیت وفاداری مشتری، ما به جستجوی سه مشکل اصلی تحقیق پرداختیم که آن ها مهمترین موانع برای حفظ حیات کسب و کارهای اینترنتی هستند که عبارت از تعویض های متعدد مشتری، هزینه...
15 صفحه اولthe impact of e-readiness on ec success in public sector in iran the impact of e-readiness on ec success in public sector in iran
acknowledge the importance of e-commerce to their countries and to survival of their businesses and in creating and encouraging an atmosphere for the wide adoption and success of e-commerce in the long term. the investment for implementing e-commerce in the public sector is one of the areas which is focused in government‘s action plan for cross-disciplinary it development and e-readiness in go...
Highlights in Semiconductor Device Development
The agricultural civilization in the cultural history of man was said to be the result of two genetic accidents which gave birth to a new species of bread wheat some 10,000 years ago, involving wild wheat and goat grass. Large-scale agricultural activity in man's society followed. Great inventions or discoveries could be considered to be such genetic accidents-mutations. New knowledge, arising ...
متن کاملSemiconductor Device Simulation by a New Method of Solving Poisson, Laplace and Schrodinger Equations (RESEARCH NOTE)
In this paper, we have extended and completed our previous work, that was introducing a new method for finite differentiation. We show the applicability of the method for solving a wide variety of equations such as Poisson, Lap lace and Schrodinger. These equations are fundamental to the most semiconductor device simulators. In a section, we solve the Shordinger equation by this method in sever...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2019
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927619012005