Electron‐Bombardment Ion Source for Mass Spectrometry of Solids

Use of an Ecr Ion Source for Mass Spectrometry

At ANSTO we have developed an Electron Cyclotron Resonance (ECR) ion source to investigate new concepts for mass spectrometers designed to measure isotopic ratios of elements such as carbon, nitrogen and oxygen. The low pressure ECR plasma presents particular challenges when used for mass spectrometry. The elements we are interested in measuring are typically present as residual gas in vacuum s...

New Cs sputter ion source with polyatomic ion beams for secondary ion mass spectrometry applications.

A simple design for a cesium sputter ion source compatible with vacuum and ion-optical systems as well as with electronics of the commercially available Cameca IMS-4f instrument is reported. This ion source has been tested with the cluster primary ions of Si(n)(-) and Cu(n)(-). Our experiments with surface characterization and depth profiling conducted to date demonstrate improvements of the an...

Ion Balance Mass Spectrometry

We have developed a technique to simultaneously compare the cyclotron frequencies of two single ions to obtain atomic mass ratios with fractional accuracies at or below 10−11. Much like a balance scale, this two-ion technique cancels many sources of noise and error – chief among them magnetic field noise. The new mass comparisons are used in combination with γ-ray wavelength measurements, perfo...

Ion Mobility Mass Spectrometry

for more complex analysers for automated sample processing and plant control. The separation time will continue to decrease; in the past there has been limited interest in fast separations but this could change as automated sample processing is developed. Increasing use of coupled techniques such as GC-GC, liquid chromatography-GC, and supercritical Suid chromatography-GC for the separation of ...

Ion Mobility-Mass Spectrometry