Fast and efficient - experiments with modern X-ray sources and CMOS APS detectors
نویسندگان
چکیده
منابع مشابه
Industrial X-ray imaging based on scintillators and CMOS APS array: direct X-ray irradiation effects
To see the effects of the direct X-ray in a Lanex screen-coupled CMOS APS imager, we measured modulation transfer function (MTF), noise power spectrum (NPS), and detective quantum efficiency (DQE). These measurements were performed under the condition of non-destructive test (NDT). By increasing the cumulative exposure on the imager, the MTF was degraded, and also leading to the DQE degradation...
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations and Advances
سال: 2015
ISSN: 2053-2733
DOI: 10.1107/s2053273315092578