High Cycle Fatigue Behavior of Polycrystalline NiAl-0.28 mol%Fe
نویسندگان
چکیده
منابع مشابه
The wetting behavior of NiAl and NiPtAl on polycrystalline alumina
In order to understand the beneficial effect of Pt on the adherence of thermally grown alumina scales, sessile drop experiments were performed to study the wetting of poly-crystalline alumina by nickel-aluminum alloys with or without platinum addition where the amount of Pt ranged from 2.4 to 10 at.%. Subsequent interfacial structure was evaluated using atomic force microscopy. Platinum additio...
متن کاملTensile Creep of Polycrystalline Near-Stoichiometric NiAl
Long term tensile creep studies were conducted on binary NiAl in the temperature range 700-1200 K with the objectives of characterizing and understanding the creep mechanisms. Inverse and normal primary creep curves were observed depending on stress and temperature. It is concluded that the primary creep of NiAl is limited by dislocation mobility. The stress exponent for creep, n, decreased fro...
متن کاملEffect of Low Cycle Fatigue Predamage on Very High Cycle Fatigue Behavior of TC21 Titanium Alloy
The effect of low cycle fatigue (LCF) predamage on the subsequent very high cycle fatigue (VHCF) behavior is investigated in TC21 titanium alloy. LCF predamage is applied under 1.8% strain amplitude up to various fractions of the expected life and subsequent VHCF properties are determined using ultrasonic fatigue tests. Results show that 5% of predamage insignificantly affects the VHCF limit du...
متن کاملFurther considerations on the high-cycle fatigue of micron-scale polycrystalline silicon
Bulk silicon is not susceptible to high-cycle fatigue but micron-scale silicon films are. Using polysilicon resonators to determine stress-lifetime fatigue behavior in several environments, oxide layers are found to show up to four-fold thickening after cycling, which is not seen after monotonic loading or after cycling in vacuo.We believe that the mechanism of thin-film silicon fatigue is ‘‘re...
متن کاملHigh-cycle Fatigue in Micron-scale Structural Films of Polycrystalline Silicon: a Reaction-layer Failure Mechanism
A study has been made of high-cycle fatigue in 2-μm thick structural films of ntype, polycrystalline silicon for MEMS applications. Using an “on-chip” test structure resonating at ~40 kHz, such thin-film polysilicon is shown to display “metal-like” stress-life fatigue behavior in room air environments, with failures occurring after lives in excess of 10 cycles at stresses as low as half the fra...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Materials Transactions, JIM
سال: 1994
ISSN: 0916-1821,2432-471X
DOI: 10.2320/matertrans1989.35.551