Imaging using lateral bending modes of atomic force microscope cantilevers
نویسندگان
چکیده
منابع مشابه
Surface Characterization with Nanometer Lateral Resolution Using the Vibration Modes of Atomic Force Microscope Cantilevers
The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution of scanning probe techniques to ultrasonics. Atomic force acoustic microscopy (AFAM) and lateral atomic force acoustic microscopy are techniques which use the vibration modes of AFM cantilevers. In the AFAM-mode the cantilever is vibrating in one of its flexural resonances while the sensor tip is ...
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V-shaped cantilevers are used widely in the atomic force microscope ~AFM! due to their perceived enhanced resistance to lateral forces in comparison to rectangular cantilevers. In this article, we rigorously investigate this premise, and in so doing establish that, contrary to established operating principles and intuition, V-shaped AFM cantilevers are generally more prone to the effects of lat...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 2004
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.1833553