Improving Linearity and Robustness of RF LDMOS by Mitigating Quasi-Saturation Effect

نویسندگان
چکیده

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Improving the Linearity and Efficiency of RF Power Amplifiers

Agrowing number of semiconductor technologies are being applied to RF power transistor applications. These technologies include Si LDMOS FET, SiGe HBT, InGaP HBT, GaAs MESFET, AlGaAs pHEMT, SiC MESFET and AlGaN/GaN HEMT. The dependencies of linearity and efficiency of such technologies are often common, such as transconductance derivatives, capacitance variations, breakdown effects and parasiti...

متن کامل

Robustness Evaluation Study of Power RF LDMOS Devices after Thermal Life Tests

This paper presents a synthesis of robustness evaluation on power RF LDMOS devices and its relation with electrical and physical behaviours after RF life-tests. It is important to understand the physical degradation mechanism effects and the liaison on drifts of critical electrical parameters after life ageing tests, in I-V such as threshold voltage (Vth), the feedback capacitance (Crss) in C-V...

متن کامل

Design and Characterization of RF-Power LDMOS Transistors

Success is not final, failure is not fatal: it is the courage to continue that counts. III " Investigation of the non-linear input capacitance in LDMOS transistors and its contribution to IMD and phase distortion, " The following papers are related to the work in this thesis but have not been included.

متن کامل

Reliability Study of Power Rf Ldmos Devices under Thermal Stress

This paper presents the results of comparative reliability study of two accelerated ageing tests for thermal stress applied on power RF LDMOS: Thermal Shock Tests (TST, air-air test) and Thermal Cycling Tests (TCT, airair test) under various conditions (with and without DC bias, TST cold and hot, different extremes temperatures ∆T). The performances shift for some critical electrical parameters...

متن کامل

Reliability study of power RF LDMOS device under thermal stress

This paper presents the results of comparative reliability study of two accelerated ageing tests for thermal stress applied on power RF LDMOS: Thermal Shock Tests (TST, air-air test) and Thermal Cycling Tests (TCT, airair test) under various conditions (with and without DC bias, TST cold and hot, different extremes temperatures ∆T). The performances shift for some critical electrical parameters...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Active and Passive Electronic Components

سال: 2019

ISSN: 0882-7516,1563-5031

DOI: 10.1155/2019/8425198