In-line interferometer for broadband near-field scanning optical spectroscopy
نویسندگان
چکیده
منابع مشابه
Near-field, broadband optical spectroscopy of metamaterials
Near-field, broadband optical spectroscopy of metamaterials is reported. A compact, easy to assemble supercontinuum light source, coupled with a near-field scanning optical microscope and spectrometer provide the means to locally probe the spectral response of a nanorod metamaterial sample. Spectral maps of near-field transmittance are obtained for the spectral range from 500 to 950 nm. In comp...
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متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
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Inverse scattering for near-field scanning optical microscopy with broadband illumination Brynmor J. Davis, Jin Sun, John C. Schotland and P. Scott Carney* The Beckman Institute for Advanced Science and Technology, University of Illinois, Urbana, Illinois 61801, USA; Department of Electrical and Computer Engineering, University of Illinois, Urbana, Illinois 61801, USA; Department of Bioengineer...
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ژورنال
عنوان ژورنال: Optics Express
سال: 2017
ISSN: 1094-4087
DOI: 10.1364/oe.25.015504