Indexation of electron diffraction patterns at grain boundaries
نویسندگان
چکیده
Grain boundaries play a vital role in materials science, and they are extensively studied through experimental numerical methods. Electron backscatter diffraction (EBSD) is commonly used to characterize crystalline materials, yet its performance often compromised at grain boundaries. The key difficulty index the overlapped electron patterns, where Kikuchi bands from multiple crystal orientations coexist. Hough-indexation fails treating EBSP, while recently proposed dictionary indexation sphere give only one triplet of Euler angles patterns. For all these methods, orientation indexing precision drops for EBSP. Here we propose an integrated Digital Image Correlation (DIC) procedure determine simultaneously precisely by registering EBSP master pattern. contribution ratio each pattern also available. Through EBSD dataset around triple point, benefits rich results method demonstrated, such as refining boundaries, revealing scan errors quantifying spatial resolution EBSD. At measurement uncertainty 0.03? both indexed orientations, same order interiors, their ratios 0.02 obtained.
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ژورنال
عنوان ژورنال: Materials Characterization
سال: 2021
ISSN: ['1044-5803', '1873-4189']
DOI: https://doi.org/10.1016/j.matchar.2021.111553