Initial fabrication and characterization of chemically etched silicon slits for KOSMOS
نویسندگان
چکیده
KOSMOS is a low-resolution, long-slit, optical spectrograph that has been upgraded at the University of Washington for its move from Kitt Peak National Observatory’s Mayall 4-m telescope to Apache Point ARC 3.5-m telescope. One additions slitviewer, which requires fabrication reflective slits, as previously used matte slits machined via wire electrical discharge machining. We explore an innovative method slit using nanofabrication methods and compare edge roughness, width uniformity, resulting scattering new fabricated original slits. find kerf surface chemically etched silicon are generally smoother than with upper limit average roughness 0.42 ± 0.03 μm versus 1.06 0.04 μm, respectively. The have standard deviations 6 3 10 higher showing reflectivity major contributor scattering, not roughness. This however, can be effectively reduced zero proper background subtraction. As widths increase, increases both types expected. Future work will consist testing comparing throughput spectrophotometric data quality these nanofabricated on-sky data, in addition making more robust against breakage finalizing manufacturing process.
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ژورنال
عنوان ژورنال: Journal of Astronomical Telescopes, Instruments, and Systems
سال: 2022
ISSN: ['2329-4221', '2329-4124']
DOI: https://doi.org/10.1117/1.jatis.8.4.045004