Interactive effects in the reactive ion etching of SiGe alloys
نویسندگان
چکیده
منابع مشابه
Depth profiling of the Ge concentration in SiGe alloys using in situ ellipsometry during reactive-ion etching
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 1991
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.104942