Laser Interference Lithography with Highly Accurate Interferometric Alignment
نویسندگان
چکیده
منابع مشابه
Beam alignment for scanning beam interference lithography
By interfering two small diameter Gaussian laser beams, scanning beam interference lithography ~SBIL! is capable of patterning linear gratings and grids in resist while controlling their spatial phase distortions to the nanometer level. Our tool has a patterning area that is up to 300 mm in diameter. The motive for developing SBIL is to provide the semiconductor industry with a set of absolute ...
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We are developing a Scanning Beam Interference Lithography (SBIL) system. SBIL represents a new paradigm in semiconductor metrology, capable of patterning large-area linear gratings and grids with nanometer overall phase accuracy. Realizing our accuracy goal is a major challenge because the interference fringes have to be locked to a moving substrate with nanometer spatial phase errors while th...
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In this paper metal-assisted chemical etching has been applied to pattern porous silicon regions and silicon nanohole arrays in submicron period simply by using positive photoresist as a mask layer. In order to define silicon nanostructures, Metal-assisted chemical etching (MaCE) was carried out with silver catalyst. Provided solution (or materiel) in combination with laser interference lithogr...
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Imaging interferometric lithography, combining off-axis illumination, multiple exposures covering different regions of spatial frequency space, and pupil plane filters to ensure uniform frequency-space coverage, is a relatively new imaging concept that provides an approach to accessing the fundamental, linear-systems-resolution limits of optics. With an air medium between the lens and the wafer...
متن کاملInterference Lithography
Interference lithography (IL) is the preferred method for fabricating periodic and quasi-periodic patterns that must be spatially coherent over large areas. IL is a conceptually simple process where two coherent beams interfere to produce a standing wave, which can be recorded in a photoresist. The spatial-period of the grating can be as fine as half the wavelength of the interfering light, all...
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ژورنال
عنوان ژورنال: Japanese Journal of Applied Physics
سال: 2005
ISSN: 0021-4922,1347-4065
DOI: 10.1143/jjap.44.6568