Low-dose scanning electron diffraction and pharmaceutical nanostructure

Scanning Transmission Electron Microscopy for Nanostructure Characterization

Three-dimensional nanostructure determination from a large diffraction data set recorded using scanning electron nanodiffraction

A diffraction-based technique is developed for the determination of three-dimensional nanostructures. The technique employs high-resolution and low-dose scanning electron nanodiffraction (SEND) to acquire three-dimensional diffraction patterns, with the help of a special sample holder for large-angle rotation. Grains are identified in three-dimensional space based on crystal orientation and on ...

Blazed Nanostructure Gratings for Electron and Atom Diffraction

Nanofabricated transmission gratings for electron diffraction are now available [1, 2] and may serve as coherent beam splitters for electron interferometry just as they already do for atom interferometry. For electron beams with kinetic energy less than 10 keV, nanostructures offer several advantages over solid crystal gratings, for example larger transmission, less inelastic scattering, and th...

High-resolution low-dose scanning transmission electron microscopy.

During the past two decades instrumentation in scanning transmission electron microscopy (STEM) has pushed toward higher intensity electron probes to increase the signal-to-noise ratio of recorded images. While this is suitable for robust specimens, biological specimens require a much reduced electron dose for high-resolution imaging. We describe here protocols for low-dose STEM image recording...

Nano-structural Characterization of Post-annealed ZnO Thin Films by X-ray Diffraction and Field Emission Scanning Electron Microscopy

ZnO thin films were deposited on Si(400) substrates by e-beam evaporation technique, and then post-annealed at different annealing temperatures (200-800°C). Dependence of the crystallographic structure, nano-strain, chemical composition and surface physical Morphology of these layers on annealing temperature were studied. The crystallographic structure of films was studied using X-Ray Diffracti...