Low Energy Positron Flux Generator for Microstructural Characterization of Thin Films

نویسندگان
چکیده

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Growth and Characterization of Thin MoS2 Films by Low- Temperature Chemical Bath Deposition Method

Transition metal dichalcogenide (TMDC) materials are very important inelectronic and optical integrated circuits and their growth is of great importance in thisfield. In this paper we present growth and fabrication of MoS2 (Molibdan DiSulfide)thin films by chemical bath method (CBD). The CBD method of growth makes itpossible to simply grow large area scale of the thin la...

متن کامل

Flux jumping in thin films.

The thermomagnetic flux-jump instability of the Bean critical state is considered, which may occur during flux penetration in thin films of type-II superconductors in a perpendicular magnetic field. We calculate the applied field B j at which this instability occurs and its dependence on the ramp rate Ḃa , on the nonlinear current-voltage curve, and on the thermal resistance between the film an...

متن کامل

Microstructural Analysis of Copper Thin Films for Characterization of Stress-induced Voiding Mechanisms

The amount of twin formation of electroplated and thermally treated copper thin films was evaluated by electron back-scattering diffraction (EBSD) analysis. The result establishes the importance of twin formation in the analysis of stress-induced voiding, and indicates that with the inclusion of a copper alloy co-element, twin formation was significantly reduced relative to pure-copper. Further...

متن کامل

Nanocrystalline CuO Thin Films for H2S Monitoring: Microstructural and Optoelectronic Characterization

Nanocrystalline copper oxide (CuO) thin films were deposited onto glass substrates by a spin coating technique using an aqueous solution of copper acetate. These films were characterized for their structural, morphological, optoelectronic properties by means of X-ray diffraction (XRD) scanning electron microscopy (SEM), UVspectroscopy and four probe method. The CuO films are oriented along (1 1...

متن کامل

Microstructural Characterization of Thin Films and Surfaces by a New Grazing Incident X-ray Diffractometer

Modern devices require the production and characterization of state-of-the-art-ultra-thin films under 10-nanometers thick. Examples can be found in integrated circuits, magnetic pickup heads and high effi-ciency solid state lasers. In “thin films” with thickness greater than 10 nanometers, the crystallographic properties (crystalline quality, orientation relationship between films and substrate...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Materials Science Forum

سال: 1992

ISSN: 1662-9752

DOI: 10.4028/www.scientific.net/msf.105-110.1985