Material budget imaging with multi-GeV electrons - calibration and applications for 2D material scanning

The technique of material budget imaging (MBI) uses multi-GeV electrons to directly measure the ϵ = x / X 0 a with thickness and its radiation length . beam particles are deflected by multiple Coulomb scattering deflection angle distribution is centered at zero width depending on traversed material. Hence, reconstruction kink angles using individual electron trajectories measured in high resolution telescopes allows estimate applying appropiate models theory, such as Highland formula. Measurements DESY II testbeam were performed various materials terms type for calibration MBI technique. an important quantity design high-energy particle detectors. Therefore, unknown can be experimentally well complex distributions imaged 2D.