Memory effects in black phosphorus field effect transistors
نویسندگان
چکیده
Abstract We report the fabrication and electrical characterization of back-gated field effect transistors with a black phosphorus (BP) channel. show that hysteresis transfer characteristic, due to intrinsic defects, can be exploited realize non-volatile memories. demonstrate gate voltage pulses allow trap store charge inside defect states, which enable memory devices endurance over 200 cycles retention longer than 30 min. use protective poly(methyl methacrylate) layer, positioned on top BP channel, does not affect properties device but avoids degradation caused by exposure air.
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ژورنال
عنوان ژورنال: 2D materials
سال: 2021
ISSN: ['2053-1583']
DOI: https://doi.org/10.1088/2053-1583/ac3f45