Metal-Density-Driven Placement for CMP Variation and Routability
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
سال: 2008
ISSN: 0278-0070
DOI: 10.1109/tcad.2008.2006148