MICROANALYSIS TECHNIQUE USING ELECTRON ENERGY LOSS SPECTROSCOPY IN HIGH VOLTAGE ELECTRON MICROSCOPY
نویسندگان
چکیده
منابع مشابه
Surface microanalysis by reflection electron energy-loss spectroscopy.
Several basic physical concepts of applying eq. Ik = I sigma Nxt to surface microanalysis by reflection electron energy-loss spectroscopy (REELS) are clarified. Here Ik and I are the integrated intensities of the core ionization edge and the low loss part, sigma is the scattering cross section of element x with atomic concentration Nx, and t is the specimen thickness. The reflected inelastic el...
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ژورنال
عنوان ژورنال: Le Journal de Physique Colloques
سال: 1984
ISSN: 0449-1947
DOI: 10.1051/jphyscol:19842100