Modeling and Measurements of Electron Beam Scattering into Adjacent Particles

نویسندگان
چکیده

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Measurements of Photon Beam Flattening Filter Using an Anisotropic Analytical Algorithm and Electron Beam Employing Electron Monte Carlo

  Introduction: This study aimed to report the measurement of photon and electron beams to configure the Analytical Anisotropic Algorithm and Electron Monte Carlo used in clinical treatment. Material and Methods: All measurements were performed in a large water phantom using a 3-dimensional scanning system (PTW, Germany). ...

متن کامل

Intrabeam Scattering Analysis of ATF Beam Measurements

At the Accelerator Test Facility (ATF) at KEK intrabeam scattering (IBS) is a strong effect for an electron machine. It is an effect that couples all dimensions of the beam, and in April 2000, over a short period of time, all dimensions were measured as functions of current. In this report we derive a simple relation for the growth rates of emittances due to IBS. We apply the theories of Bjorke...

متن کامل

Rigorous analytical modeling of light scattering by particles and spherical surfaces in a focused beam

Light scattering by a sphere has long been interest of studying and developing different microscopies that are used for studying different objects such as biological cells, molecules, atoms. The generalized Lorenz-Mie theory (GLMT) has been well developed for analyzing the scattering effects. In this paper, we present a novel interpretation of the scattering mechanism. A converging beam becomes...

متن کامل

synthesis of amido alkylnaphthols using nano-magnetic particles and surfactants

we used dbsa and nano-magnetic for the synthesis of amido alkylnaphtols.

15 صفحه اول

New Measurements of the Transverse Beam Asymmetry for Elastic Electron Scattering from Selected Nuclei

S. Abrahamyan, A. Acha, A. Afanasev, Z. Ahmed, H. Albataineh, K. Aniol, D. S. Armstrong, W. Armstrong, J. Arrington, T. Averett, B. Babineau, S.L.Bailey, J. Barber, A. Barbieri, A. Beck, V. Bellini, R. Beminiwattha, H. Benaoum, J. Benesch, F. Benmokhtar, P. Bertin, T. Bielarski, W. Boeglin, P. Bosted, F. Butaru, E. Burtin, J. Cahoon, A. Camsonne, M. Canan, P. Carter, C.C. Chang, G. D. Cates, Y....

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Microscopy and Microanalysis

سال: 2009

ISSN: 1431-9276,1435-8115

DOI: 10.1017/s143192760909415x