Modeling of Forming Limit Bands for Strain-Based Failure-Analysis of Ultra-High-Strength Steels

Determination of Buckling Limit of Strain in Cold Roll Forming through Finite Element Analysis

In this study, "Buckling Limit of Strain" (B.L.S.) is introduced as one of the most important limiting factors in cold roll forming process. B.L.S. is calculated by the finite element procedure. Then for two particular processes with existing analysis and experimental results, B.L.S. has been determined and evaluated. LUSAS 12.3 is used for finite element analysis. The results show that when bu...

Determination of Buckling Limit of Strain in Cold Roll Forming through Finite Element Analysis

In this study, Buckling Limit of Strain (B.L.S.) is introduced as one of the most important limiting factors in cold roll forming process. B.L.S. is calculated by the finite element procedure. Then for two particular processes with existing analysis and experimental results, B.L.S. has been determined and evaluated. LUSAS 12.3 is used for finite element analysis. The results show that when buck...

High Strain Rate Characterization of Advanced High Strength Steels

High-Strength Bainitic Steels

With careful design, mixed microstructures consisting of fine plates of upper bainitic ferrite separated by thin films of stable retained austenite have exhibited impressive combinations of strength and toughness in highsilicon bainitic steels. The silicon suppresses the precipitation of brittle cementite leading to an improvement in toughness. The essential principles governing the optimisatio...

fabrication of new ion sensitive field effect transistors (isfet) based on modification of junction-fet for analysis of hydronium, potassium and hydrazinium ions

a novel and ultra low cost isfet electrode and measurement system was designed for isfet application and detection of hydronium, hydrazinium and potassium ions. also, a measuring setup containing appropriate circuits, suitable analyzer (advantech board), de noise reduction elements, cooling system and pc was used for controlling the isfet electrode and various characteristic measurements. the t...