Monte Carlo Simulation of Electron Energy Loss Spectra of Group III-Nitride Nanoscale Semiconductors
نویسندگان
چکیده
منابع مشابه
Monte Carlo Simulation of Electron Energy Loss Spectra of Group III-Nitride Nanoscale Semiconductors
Group III-nitride semiconductors are a main research interest in the optoelectronics because of their unique physical and electronic properties [1]. The thin layers of these semiconductors at the nanoscale are now very common in the modern devices. Hence, proper materials characterizations with high spatial and compositional resolution such as electron energy loss spectroscopy (EELS) are essent...
متن کاملTotal skin electron therapy (TSET): Monte Carlo Simulation and implementation
Introduction: Total skin electron irradiation technique is used in treatment of the mycosis fungoid. The implementation of this technique requires non-standard measurements and complex dosimetry methods. Operating procedures for total skin electron irradiation and its dosimetry vary in different radiation therapy centers in the world. In this article, validation of TSET techniq...
متن کاملPolarization induced electron populations in III - V nitride semiconductors
Polarization induced electron populations in III-V nitride semiconductors Transport, growth, and device applications by Debdeep Jena The III-V nitride semiconductors (GaN, AlN, InN) exhibit unusually large electronic polarization fields. These polarization fields can be engineered to achieve carrier confinement, doping, and band engineering in novel ways. This work presents work in engineering ...
متن کاملmonte carlo simulation of varian clinac 2100c electron beams
background: the purpose of this study was to investigate the application of the monte carlo technique to calculate and analysis of dosimetric parameters for electron beams used in radiotherapy. this technique is based on statistical method and has a powerful role in different radiotherapy aspects. materials and methods: the simulated medical linear accelerator was the varian clinac 2100c. the e...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2014
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927614004826