Multi-Probe Atomic Force Microscopy Using Piezo-Resistive Cantilevers and Interaction between Probes

Preamplifying cantilevers for dynamic atomic force microscopy

A cantilever type has been developed for dynamic force microscopy by the addition of a harmonic oscillator in the form of a paddle to atomic force microscopy cantilevers. These cantilevers provide resonant amplification of periodic interactions between the probe and the substrate when the laser is aligned on the paddle. The cantilevers were explored for their use in piezoresponse force microsco...

Atomic force microscopy cantilevers beyond imaging

“Torsional tapping” atomic force microscopy using T-shaped cantilevers

Nic Mullin, Cvetelin Vasilev, Jaimey D. Tucker, C. Neil Hunter, Christa H. M. Weber, and Jamie K. Hobbs Department of Physics and Astronomy, University of Sheffield, The Hicks Building, Hounsfield Road, Sheffield, South Yorkshire S3 7RH, United Kingdom Department of Molecular Biology and Biotechnology, University of Sheffield, Firth Court, Western Bank, Sheffield, South Yorkshire S10 2TN, Unite...

Magnetic force microscopy using fabricated cobalt-coated carbon nanotubes probes

Magnetic force microscope ( MFM ) is a powerful technique for mapping the magnetic force gradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used to fabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effective technique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT) on the atomic force microscope (...

The resistive switching in TiO2 films studied by conductive atomic force microscopy and Kelvin probe force microscopy

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