Multiparametric analytical quantification of materials at nanoscale in tapping force microscopy

Atomic force microscopy (AFM) is a powerful technique for accurate, reliable and non-destructive imaging characterization of materials at the nanoscale. Among numerous AFM methods, amplitude modulation or tapping mode (AM-AFM) an established method most commercial systems. Despite its high spatial resolution sensitivity, quantitative by AM-AFM lag behind other advanced methods as far quantification properties concerned. In this paper fully analytical multiparametric approach proposed which simultaneously quantifies Hamaker constant viscoelastic materials. The main advantage lies in inclusion adhesion to calculate viscoelasticity, makes it superior current equations used community. accuracy validated several simulations experiments comparison with nanoindentation results, strongly support candidacy choice material dynamic AFM.