Nanorheology Mapping by Atomic Force Microscopy
نویسندگان
چکیده
منابع مشابه
Force sensing and mapping by atomic force microscopy
Over the past 15 years, advances in the ¢eld of atomic force microscopy (AFM) have broadened its use from a high-resolution imaging instrument to a device capable of detecting and quantifying single molecular forces between surfaces in nearnative conditions. This article reviews developments in the force sensing ¢eld and focuses particularly on research that has seen the AFM utilised to produce...
متن کاملSingle ricin detection by atomic force microscopy chemomechanical mapping
The authors report on a study of detecting ricin molecules immobilized on chemically modified Au 111 surface by chemomechanically mapping the molecular interactions with a chemically modified atomic force microscopy AFM tip. AFM images resolved the different fold-up conformations of single ricin molecule as well as their intramolecule structure of Aand B-chains. AFM force spectroscopy study of ...
متن کاملRelative microelastic mapping of living cells by atomic force microscopy.
The spatial and temporal changes of the mechanical properties of living cells reflect complex underlying physiological processes. Following these changes should provide valuable insight into the biological importance of cellular mechanics and their regulation. The tip of an atomic force microscope (AFM) can be used to indent soft samples, and the force versus indentation measurement provides in...
متن کاملAcoustic microscopy by atomic force microscopy
We have constructed an atomic force microscope enabling one to image the topography of a sample, and to monitor simultaneously ultrasonic surface vibrations in the MHz range. For detection of the distribution of the ultrasonic vibration amplitude, a part of the position-sensing light beam reflected from the cantilever is directed to an external knife-edge detector. Acoustic images taken on the ...
متن کاملAtomic Force Microscopy Application in Biological Research: A Review Study
Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: KOBUNSHI RONBUNSHU
سال: 2005
ISSN: 0386-2186,1881-5685
DOI: 10.1295/koron.62.476