Nanoscale spatial mapping of mechanical properties through dynamic atomic force microscopy
نویسندگان
چکیده
منابع مشابه
Probing physical properties at the nanoscale using atomic force microscopy
Techniques that measure physical properties at the nanoscale with high sensitivity are significantly limited considering the number of new nanomaterials being developed. The development of atomic force microscopy (AFM) has lead to significant advancements in the ability to characterize physical properties of materials in all areas of science: chemistry, physics, engineering, and biology have ma...
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ژورنال
عنوان ژورنال: Beilstein Journal of Nanotechnology
سال: 2019
ISSN: 2190-4286
DOI: 10.3762/bjnano.10.132