New Insight into Cellulose Structure by Atomic Force Microscopy Shows the Iα Crystal Phase at Near-Atomic Resolution

Atomic force microscopy characterization of cellulose nanocrystals.

Cellulose nanocrystals (CNCs) are gaining interest as a "green" nanomaterial with superior mechanical and chemical properties for high-performance nanocomposite materials; however, there is a lack of accurate material property characterization of individual CNCs. Here, a detailed study of the topography, elastic and adhesive properties of individual wood-derived CNCs is performed using atomic f...

High Resolution Image with Multi-wall Carbon Nanotube Atomic Force Microscopy Tip (RESEARCH NOTE)

In this paper, a simple and reproducible approach for attaching the multi-wall carbon nanotubes (MWNTs) to the apex of the atomic force microscope probe has been proposed. For this purpose, the dielectrophoresis method was applied due to its simple performance, cheapness and reliability. In this method, various parameters such as voltage, frequency, concentration of carbon nanotubes solution an...

5 Atomic force microscopy ’ s path to atomic resolution

We review the progress in the spatial resolution of atomic force microscopy (AFM) in vacuum. After an introduction of the basic principle and a conceptual comparison to scanning tunneling microscopy, the main challenges of AFM and the solutions that have evolved in the first twenty years of its existence are outlined. Some crucial steps along the AFM’s path towards higher resolution are discuss...

Can atomic force microscopy achieve atomic resolution in contact mode?

Atomic force microscopy operating in the contact mode is studied using total-energy pseudopotential calculations. It is shown that, in the case of a diamond tip and a diamond surface, it is possible for a tip terminated by a single atom to sustain forces in excess of 30 nN. It is also shown that imaging at atomic resolution may be limited by blunting of the tip during lateral scanning.

Crystal Lattice Imaging Using Atomic Force Microscopy