New voltage and temperature scalable gate delay model applied to a 14nm technology
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Indonesian Journal of Electrical Engineering and Computer Science
سال: 2020
ISSN: 2502-4760,2502-4752
DOI: 10.11591/ijeecs.v20.i3.pp1210-1220