Nucleation and growth of PrBa2Cu3O7−δ barrier layers on ramps in DyBa2Cu3O7−δ studied by atomic force microscopy
نویسندگان
چکیده
منابع مشابه
Adhesion forces between protein layers studied by means of atomic force microscopy.
Adhesion forces between different protein layers adsorbed on different substrates in aqueous media have been measured by means of an atomic force microscope using the colloid probe technique. The effects of the loading force, the salt concentration and pH of the medium, and the electrolyte type on the strength, the pull-off distance, and the separation energy of such adhesion forces have been a...
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Amyloids are usually used to refer to a wide range of fibrous nanostructures formed from natural and synthetic proteins and peptides. The self-propagating protein aggregates are rich in ┚-sheets, which stack in hundreds to thousands units perpendicular to the fibrous axis, forming fibrils 5-15 nm in width and several micrometers in length (Dobson, 1999; Jaroniec et al., 2004; Luhrs et al., 2005...
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A combination of atomic force microscopy, scanning election microscopy, transmission electron microscopy, energy dispersive spectroscopy, electron diffraction, and X-ray diffraction were used to study reactions of 0.5–500 mg/L aqueous Pb with Ca5(PO4)3OH, hydroxylapatite (HAP), at pH 6 and 22 8C. Following 2 h reaction time, concentrations of Pbaq ([Pbaq]) decreased from 500 mg/L to ,100 mg/L, ...
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Zein is one of the best biopolymer for edible film making and sugars are natural plasticizers for biopolymers. In this research, sugars (fructose, galactose and glucose) at three levels (0.5, 0.7, 1 g/g of zein) were used as plasticizers for zein protein films and their water vapor permeability (WVP), oxygen permeability (OP) and atomic force microscopy (AFM) topography were studied. The p...
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Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 1996
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.115951