Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins

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Odd electron diffraction patterns in silicon nanowires and silicon thin films explained by microtwins and nanotwins

Odd electron diffraction patterns (EDPs) have been obtained by transmission electron microscopy (TEM) on silicon nanowires grown via the vapour-liquid-solid method and on silicon thin films deposited by electron beam evaporation. Many explanations have been given in the past, without consensus among the scientific community: size artifacts, twinning artifacts or, more widely accepted, the exist...

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ژورنال

عنوان ژورنال: Journal of Applied Crystallography

سال: 2009

ISSN: 0021-8898

DOI: 10.1107/s0021889808042131