Odd-order probe correction technique for spherical near-field antenna measurements

Double -Step -Scanning Technique for Spherical Near-Field Antenna Measurements

Probe-corrected spherical near-field antenna measurements with an arbitrary probe set certain requirements on an applicable scanning technique. The computational complexity of the general high-order probe correction technique for an arbitrary probe, that is based on the scanning, is , where is proportional to the radius of the antenna under test (AUT) minimum sphere in wavelengths. With the pre...

General Analytic Correction for Probe-Position Errors in Spherical Near-Field Measurements

A general theoretical procedure is presented to remove known probe-position errors in spherical near-field data to obtain highly accurate far fields. We represent the measured data as a Taylor series in terms of the displacement errors and the ideal spectrum of the antenna. This representation is then assumed to be an actual near field on a regularly spaced error-free spherical grid. The ideal ...

Cylindrical/Spherical Near-Field Antenna Measurement System

A low-cost, fully operational cylindrical and spherical near-field antenna measurement system designed, built, and programmed by a University of Rhode Island Capstone team is presented. The goal of this project was to modify an existing planar near-field system and apply new processing techniques to extract the far-field patterns of an antenna under test (AUT) of any physical shape. The aim of ...

Advanced Spherical Antenna Measurements

Near-field microscope probe for far infrared time domain measurements

A near-field probe fabrication technique for far-infrared frequencies based on photoconducting antennas is developed. A subwavelength-size field source is accomplished by means of an aperture and protruding high refractive index tip. The near-field probe is tested by using free space traveling electromagnetic pulses with a broadband spectrum in the range of 0.3–1.5 THz. A spatial resolution of ...