On the Stress Measurement by Means of an Automatically Step-Scanning X-Ray Diffractometer
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چکیده
منابع مشابه
An X-ray diffractometer using mirage diffraction
Some characteristics are reported of a triple-crystal diffractometer with a (+, -, +) setting of Si(220) using mirage diffraction. The first crystal is flat, while the second and third crystals are bent. Basically, the first crystal is used as a collimator, the second as a monochromator and the third as the sample. The third crystal also works as an analyzer. The advantages of this diffractomet...
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We investigate the use of an Amptek Cool-X X-ray Generator for an instructional tool in the physics of x-rays, as well as a source for x-rays for crystal diffraction experiments. The x-ray source is a solid-state two-phase air-cooled source with a timevarying photon output. Two detectors are used in this experiment, the first being an Amptek X-123 Spectrometer and the second a combination scint...
متن کاملAn X-ray diffractometer using mirage diffraction. Erratum
Errors in the article by Fukamachi, Jongsukswat, Ju, Negishi, Hirano & Kawamura [J. Appl. Cryst. (2014), 47, 1267-1272] are corrected.[This corrects the article DOI: 10.1107/S1600576714012114.].
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ژورنال
عنوان ژورنال: Journal of the Society of Materials Science, Japan
سال: 1968
ISSN: 1880-7488,0514-5163
DOI: 10.2472/jsms.17.1048