Patterned Wheels for Faster Dimpling and Improved Specimen Preparation
نویسندگان
چکیده
منابع مشابه
Improved Skips for Faster Postings List Intersection
Information retrieval can be achieved through computerized processes by generating a list of relevant responses to a query. The document processor, matching function and query analyzer are the main components of an information retrieval system. Document retrieval system is fundamentally based on: Boolean, vector-space, probabilistic, and language models. In this paper, a new methodology for mat...
متن کاملImproved Skips for Faster Postings List Intersection
Information retrieval can be achieved through computerized processes by generating a list of relevant responses to a query. The document processor, matching function and query analyzer are the main components of an information retrieval system. Document retrieval system is fundamentally based on: Boolean, vector-space, probabilistic, and language models. In this paper, a new methodology for mat...
متن کاملimproved skips for faster postings list intersection
information retrieval can be achieved through computerized processes by generating a list of relevant responses to a query. the document processor, matching function and query analyzer are the main components of an information retrieval system. document retrieval system is fundamentally based on: boolean, vector-space, probabilistic, and language models. in this paper, a new methodology for mat...
متن کاملSpecimen Preparation for Electron Microscopy
In general the SEM sample preparation techniques are more or less similar to the metallographic sample preparation technique for optical microscopy, because both the microscopes reveals the surface topography of sample. In SEM a focussed beam of electrons scans over the specimen surface and the electrons emitted from the sample surface controls the brightness of the CRT spot which also scans th...
متن کاملTEM specimen preparation techniques
Transmission electron microscopy (TEM) is a powerful tool for the investigation of the microstructure of materials, providing crystallographic information and composition at the nanometer scale. For such studies, samples should be transparent to the electron beam. In this review, TEM sample preparation techniques for different classes of materials, such as metals and alloys, multilayered coatin...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2003
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927603444048