Precision Measurement of Silicon Wafer Resistivity Using Single-Configuration Four-Point Probe Method

طراحی و ساخت دستگاه four-point probe station

یکی از ویژگی های اساسی مواد هادی مقاومت الکتریکی آن هاست که با داشتن تعداد الکترونهای آزاد لایه ظرفیت می توان مقاومت الکتریکی آن ماده را پیدا نمود. با اندازه گیری مقاومت الکتریکی مواد می توان ویژگیها و مشخصات ماده را تعیین نمود. در این پایان نامه بنا داریم به اندازه گیری مقاومت الکتریکی با استفاده چهار پراب همراستا با فاصله ثابت از هم که در تماس با سطح یک ویفر سیلیکونی هستند اقدام کنیم. در عم...

Evaluation of accuracy, precision and consensus of four laboratory glucose measurement kits with reference method

Abstract         Background and Objective: According to recent changes in diagnostic criteria for diabetes, the harmonization of results obtained from various methods and systems by considering their accuracy and precision is essential. This study aimed to evaluate the accuracy, precision and consensus of some routine laboratory glucose kits in co...

Four-point probe characterization of 4H silicon carbide

Measurement of Figure of Merit for a Single β-Silicon Carbide Nanowire by the Four-Point Three-ω Method

The thermoelectric figure of merit (ZT) of a single β-Silicon Carbide (SiC) nanowire (NW) was measured using the four-point three-omega (3-ω) method for the first time. The electrical conductivity (σ), thermal conductivity (κ), and Seebeck coefficient (S) were measured on the same measurement platform consisting of four point probe. To this end, we developed a novel technique in which focused i...

Direct measurement of surface-state conductance by microscopic four-point probe method

For in situ measurements of local electrical conductivity of well defined crystal surfaces in ultrahigh vacuum, we have developed microscopic four-point probes with a probe spacing of several micrometres, installed in a scanningelectron-microscope/electron-diffraction chamber. The probe is precisely positioned on targeted areas of the sample surface by using piezoactuators. This apparatus enabl...