Progress in Testing of Ultrahigh-Speed ICs. Optical IC Probing Technology.
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Journal of SHM
سال: 1995
ISSN: 1884-1198,0919-4398
DOI: 10.5104/jiep1993.11.2_18