Radiation Hardness Assurance Testing of Microelectronic Devices and Integrated Circuits: Radiation Environments, Physical Mechanisms, and Foundations for Hardness Assurance

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ژورنال

عنوان ژورنال: IEEE Transactions on Nuclear Science

سال: 2013

ISSN: 0018-9499,1558-1578

DOI: 10.1109/tns.2013.2254722