Scheduling semiconductor device test operations on multihead testers
نویسندگان
چکیده
منابع مشابه
Scheduling Semiconductor Device Test Operations on Multihead Testers
Past attempts to devise scheduling methods for the device test operations of semiconductor manufacturing firms fail to address a significant characteristic of multiple-head test systems—the dependency of processing rates on the lots processed simultanuously on the testers. Since the problem has never been modeled accurately in the scheduling literature, feasibility and performance of previously...
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ژورنال
عنوان ژورنال: IEEE Transactions on Semiconductor Manufacturing
سال: 1999
ISSN: 0894-6507
DOI: 10.1109/66.806130