Scrutiny of structural disorder using Raman spectra and Tauc parameter in GeTe2 thin films
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چکیده
منابع مشابه
Raman Spectra and Structural Analysis in ZrOxNy Thin Films
Raman spectroscopy has been used as a local probe to characterize the structural evolution of magnetron-sputtered decorative zirconium oxynitride ZrOxNy films which result from an increase of reactive gas flow in the deposition The lines shapes, the frequency position and widths of the Raman bands show a systematic change as a function of the reactive gas flow (a mixture of both oxygen and nitr...
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ژورنال
عنوان ژورنال: Journal of Physics: Conference Series
سال: 2017
ISSN: 1742-6588,1742-6596
DOI: 10.1088/1742-6596/869/1/012018