Selective I/O scan: A diagnosable design technique for VLSI systems
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Computers & Mathematics with Applications
سال: 1987
ISSN: 0898-1221
DOI: 10.1016/0898-1221(87)90078-2